Sequential analysis: tests and confidence intervals / David Siegmund

Auteur: Siegmund, David (1941-) - AuteurType de document: Monographie Collection: Springer series in statistics Langue: anglaisPays: Etats UnisÉditeur: New York : Springer-Verlag, 1985Description: 1 vol. (xi-272 p.) : ill. ; 25 cm ISBN: 0387961348 ; rel. Bibliographie: Bibliogr. p. [263]-270. Index. Sujets MSC: 62Lxx Statistics -- Sequential methods
62-02 Statistics -- Research exposition (monographs, survey articles)
60K05 Probability theory and stochastic processes -- Special processes -- Renewal theory
60K15 Probability theory and stochastic processes -- Special processes -- Markov renewal processes, semi-Markov processes
En-ligne: Springerlink
Location Call Number Status Date Due
Salle R 10792-01 / 62 SIE (Browse Shelf) Available

Bibliogr. p. [263]-270. Index

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